Hong Kong, China -- (ReleaseWire) -- 10/17/2018 --New report published by Global Info Research which offers insights on the global Semiconductor Automated Test Equipment (ATE) market.

Semiconductor automated test equipment (ATE) consists of a variety of instruments or cards for testing memory, digital, and mixed-signal at the wafer and Packaged stages, and single-chip system (SoC) components that are also in the wafer and Packaged stages.

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Global Semiconductor Automated Test Equipment (ATE) Market: Forecast by Type / Application / Region

The global Semiconductor Automated Test Equipment (ATE) market is valued at 3481.3 million US$ in 2017 and will reach 4478.8 million US$ by the end of 2025, growing at a CAGR of 3.2 % during 2018-2025.

The major players in global Semiconductor Automated Test Equipment (ATE) market include:Teradyne, Advantest, LTX-Credence, Cohu, Astronics, Chroma, SPEA, Averna, Shibasoku, ChangChuan, Macrotest, Huafeng and Others.

On the basis of product, the Semiconductor Automated Test Equipment (ATE) market is primarily split into: Wafer ATE and Packaged Device ATE.

On the basis on the end users/applications covers: Automotive Electronics, Consumer Electronics, Communications, Computer, Industrial/Medical and Military/Aviation.

The global Semiconductor Automated Test Equipment (ATE) market is valued at 3481.3 million US$ in 2017 and will reach 4478.8 million US$ by the end of 2025, growing at a CAGR of 3.2 % during 2018-2025.

Teradyne, Advantest and LTX-Credence (Xcerra) captured the top three production value share spots in the semiconductor automated test equipment (ATE) market in 2017. Teradyne dominated with 39.86% production value share, followed by Advantest with 35.87% production value share and LTX-Credence (Xcerra) with 6.82% production value share.

The market size of semiconductor automatic test equipment is expected to grow due to the growing SoC system and the surge in demand for consumer electronics products. In a rapidly changing market environment, device performance continues to challenge the limits of ATE system functionality. Especially nowadays, the increase of analog and mixed-signal ICs has made ATE equipment originally used for testing pure digital ICs unable to meet new test requirements. The elimination of test equipment has accelerated and the test cost has increased.

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Related Information:
United States Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
Europe Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
North America Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
Asia-Pacific Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
China Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
EMEA Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023
Global Semiconductor Automated Test Equipment (ATE) Market 2018 Forecast to 2023

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